- Title:
- Optical feedback interferometry for sensing application
- Presenter:
- Professor Thierry Bosch
- Date:
- December 03, 2004
- Abstract:
- The self-mixing optical feedback interferometric effect occurs when a small fraction of the light emitted by a semiconductor laser (SL) is backscattered or reflected by an external target and re-enters the laser active cavity, resulting in the modulation of both the amplitude and the frequency of the lasing field. As the modulation carries information about the external target as well as the SL, the observed emitted power, also called the self-mixing signal, can be used to measure the metrological quantities as well as the parameters of the SL itself. In the presentation Professor Bosch will give an overview and recent advances of the research area.
BIOGRAPHY
Professor Thierry BOSCH got his PhD from National Institute of Applied Science of Toulouse (INSAT) in 1992. In 1993, he joined the Department of Automatic Control and Production Systems at the Engineering School of Mines of Nantes, as an Assistant Professor. He was head of group on optoelectronics, instrumentation and sensors from 1993 to 2000. He is presently professor in the Engineering School ENSEEIHT of Toulouse and Director of Electronics Laboratory of ENSEEIHT (LEN7). His research interests are related to laser industrial instrumentation development including range finding techniques, vibration and velocitymeasurements. He has cooperated in several programs of R&D with European companies active in the areas of sensor design, metrology, transportationor avionics. He has organized several national and international meetings either as a Chairman or a Steering/Program Committee member. He has been Guestco-Editor for Journal of Optics (June 1998, November 2002) and Optical Engineering (January 2001) on Distance/Displacement Measurements by Laser Techniques and chaired the International Conference ODIMAP in 1997. With Professor Marc Lescure, he has edited the Milestone Volume entitled " Selected Papers on Laser Distance Measurements " published by SPIE in 1995. He is now the Chairman of the IEEE Instrumentation & Measurement Technical Committee on Laser & Optical Systems and serves as an Associate Editor ofthe IEEE Transactions on Instrumentation & Measurement.
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